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Connector Test System

The Connector Test Solution is designed for laboratory and manufacturing use in network infrastructure and automotive connector manufacturers. Through use of custom PCBs, any type of connector can be fully characterized for RF and continuity parameters.

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Far-end S-parameters

Dual-ended measurement enables measurement of far-end parameters. These S-parameters are commonly referred to as insertion loss and FEXT (far-end cross-talk). MMVNA measures all combinations of these parameters from both main and remote units with the far end transmission against IEEE 802.3bw limits. A utility to perform “set reference” provides zero reference for dual-ended measurements.

VNA Manager IL